Electron Microprobe Analysis
Capabilities |
JEOL JXA-8600 |
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Four
wavelength dispersive spectrometers for quantitative elemental analysis |
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Beryllium window Energy Dispersive Spectrometer | |
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Backscattered and secondary electron imaging | |
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X-ray mapping | |
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Stage automation for unattended operation | |
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Analysis for elements from Be to U | |
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On-line ZAF and Frz matrix corrections | |
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Thin-film analysis | |
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Upgraded system automation (1997) Geller Dqant |